World-Class Reflectometers from OPTX – for measurement of thin film thickness and refractive index

OPTX™ reflectometers are the ideal solution for routine measurement of thin film thickness and refractive index.

Our instruments combine best-in-class hardware with intuitive, high-performance material modeling software to make measurement tasks fast, reliable and simple.

High performance is matched with the lowest prices on the market for an unbeatable combination.